Fast IR laser mapping ellipsometry for the study of functional organic thin films - Analyst (RSC Publishing) DOI:10.1039/C4AN01853B
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The scanning laser ellipsometer MicroScan allows local measurements and... | Download Scientific Diagram
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1: Schematic drawing of a null ellipsometer. A light source (a laser in... | Download Scientific Diagram
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Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 1020 cm−3 | Scientific Reports
